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statistical pattern recognition, nonparametric methods, k-NN rules, parallel classifiers, quality inspection, ferrite cores
2003-02-05T09:25:57Z
2012-12-09T13:40:08+01:00
dvips 5.495 Copyright 1986, 1992 Radical Eye Software
2020-02-02T17:03:10+01:00
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A parallel net of (1-NN, k-NN) classifiers for optical inspection of surface defects in ferrites
A. Jóźwik, L. Chmielewski, M. Skłodowski, W. Cudny
Machine Graphics & Vision, 7(1-2):99–112, 1998
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